Blaney Harper's practice focuses on strategic patent litigation representing electronics, software, and information technology companies in matters such as patent enforcement in United States District Courts and the International Trade Commission (ITC). Blaney also represents and counsels clients concerning patent portfolio development and patent prosecution and appeal, including Inter Partes Review, in the USPTO. Blaney co-chairs the Firm's ITC practice and is the IP Practice Coordinator for the Washington Office.
Blaney's experience covers a broad cross-section of technology, including semiconductor structures, microprocessor architecture, memory, application-specific integrated circuits, and related hardware and software for applications such as wireless communications, fiber-optic networks, distributed computing, digital image processing, computational linguistics, computer controlled radiology, computer peripherals, accelerometers, and other electronic sensors. Blaney's engineering experience gives him keen insight into many technology issues.
Blaney has been the lead lawyer concerning infringement allegations on multiple patents on behalf of Cree Inc. (concerning LEDs), Imagination Technologies (concerning Graphic Processors), Vizio (TVs), Nexteer (auto parts), Qualcomm (communication circuits), Freescale (packaged semiconductors), Eastman Kodak Company (digital cameras), Sercel I/O (MEMs accelerometers), Lucent (internet infrastructure), and others.
Blaney has been recognized in Intellectual Asset Management (IAM) 1000 (2014-2017) ("a man of action who really knows how to drive a matter towards the right outcome for his client.") and in Managing Intellectual Property "2015 USIP Stars."
Commission Defers to PTAB’s Invalidation of a Single Claim in an Otherwise Blanket Affirmance of the ALJ’s Initial Determination, ITC Blog
Disputed Material Facts Snap Complainant’s Motion for Summary Determination of Economic Prong of Domestic Industry, ITC Blog
- 2012年8月15日 (新竹場) 及2012年8月17日 (台北場)專利權跨國訴訟實務研討會
- Georgetown University (J.D. magna cum laude, Order of the Coif 1991); University of Vermont (M.S.E.E. 1987); University of Michigan (B.S.E.E. 1982)
- New York, District of Columbia, and registered to practice before the United States Patent and Trademark Office